A simple algorithm which unifies the
calibration procedures for Scattering and Load Pull
measurements is proposed. The new technique is
particulary useful when measuring non-insertable
devices and for on-wafer characterizations. The
algorithm was compared with other well
established calibration techniques with very good
results in terms of accuracy.
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RF0907002--A_Unified_Calibration_Algorithm_for_Scattering_and_Load-Pull_Measurement.pdf